搜索包含 Institution of Electrical Engineers. Science 的图书 - 暨南大学图书馆

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	Readings in financial institution management : modern techniques for a global industry 0 索取号：F811.2/E993 作者：出版社：St Leonards, N.S.W. : Allen & Unwin, 1999.		Handbook of logic in computer science 0 索取号：TP3/E9913 作者：出版社：Oxford : Clarendon Press ; New York : Oxford University Press, 1992-<1995 >
	Parallel algorithms in computational science 0 索取号：TP3/E996 作者：Heermann、 Dieter W.、Burkitt、 A. N. (Anthony N.)、出版社：Berlin ; New York : Springer-Verlag, 1991.		Principles of computer science : concepts, algorithms, data structures, and applications 0 索取号：TP3/E909 作者：Carberry、 M. S.、Cohen、 A. Toni.、Khalil、 Hatem M.、出版社：U.S.A. Rockville, Md. : Computer Science Press, 1986.
	Foundations of computer science 0 索取号：TP3/E804 作者：Carberry、M.S.、Carberry、 M. S.、出版社：Potomac, Md. : Computer Science Press, 1979.		Great ideas in computer science : a gentle introduction 0 索取号：TP3/E9914 作者：Biermann、 Alan W.、 1939-、出版社：Cambridge, Mass. : MIT Press, 1990.
	Aspects and prospects of theoretical computer science : 6th International Meeting of Young Computer Scientists, Smolenice, Czechoslovakia, November 19-23, 1990 : proceedings 0 索取号：TP3/E9910 作者：International Meeting of Young Computer Scientists (6th : 1990 : Smolenice、 Slovakia)、Dassow、 J.、Kelemen、 Jozef、 1951-、出版社：Berlin ; New York : Springer-Verlag, 1990.		Proceedings 0 索取号：TP29-53/E904/1 作者：IEEE International Conference on Office Automation (1st : 1984 : New Orleans、 La.)、Taylor、 R. W. (Robert William)、 1932-、Institute of Electrical and Electronics Engineers.、出版社：Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.
	International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton 0 索取号：TP274-53/E801/1977 作者：International Conference on New Developments in Automatic Testing、 Brighton、 Eng.、 1977.、Institution of Electrical Engineers. Control and Automation Division.、Institution of Electrical Engineers. Electronics Division.、出版社：London : The Institution, 1977.		Algebra for computer science 0 索取号：TP274/E902 作者：G·Ⅱrding、 Lars、 1919-、Tambour、 Torbj·□ rn.、出版社：New York : Springer-Verlag, 1988.
	Electrical and electronic instrumentation 0 索取号：TP274/E9016 作者：Chiang、 Hai Hung.、出版社：New York : Wiley, 1984.		Multivariable control system design and applications : [proceedings of a conference held] 1-3 September 1971, [at the] University of Manchester, Owens Park 0 索取号：TP273-53/E808 作者：UKAC Control Convention、 4th、 University of Manchester、 1971.、United Kingdom Automation Council.、Institution of Electrical Engineers.、University of Manchester.、出版社：London, Institution of Electrical Engineers, 1971.
	European Conference on Electronic Design Automation (EDA84), 26-30 March 1984 0 索取号：TP27-53/E902 作者：European Conference on Electronic Design Automation (1984 : University of Warwick)、Institution of Electrical Engineers. Electronics Division.、British Computer Society.、出版社：London ; New York : Venue The Institution of Electrical Engineers, 1984.		1985 IEEE International Conference on Robotics and Automation, March 25-28, 1985, Marriott's Pavilion Hotel, St. Louis, Missouri 0 索取号：TP252-53/E901/1985 作者：IEEE International Conference on Robotics and Automation (1985 : St. Louis、 Mo.)、IEEE Computer Society.、Institute of Electrical and Electronics Engineers.、出版社：Silver Spring, MD : IEEE Computer Society Press ; Los Angeles CA : Order from IEEE Computer Society, 1984.
	Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1985 作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.		Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio 0 索取号：TP216-53/E901/1982 作者：IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、出版社：New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.

	Readings in financial institution management : modern techniques for a global industry 0 索取号：F811.2/E993 作者：出版社：St Leonards, N.S.W. : Allen & Unwin, 1999.		Handbook of logic in computer science 0 索取号：TP3/E9913 作者：出版社：Oxford : Clarendon Press ; New York : Oxford University Press, 1992-<1995 >
	Parallel algorithms in computational science 0 索取号：TP3/E996 作者：Heermann、 Dieter W.、Burkitt、 A. N. (Anthony N.)、出版社：Berlin ; New York : Springer-Verlag, 1991.		Principles of computer science : concepts, algorithms, data structures, and applications 0 索取号：TP3/E909 作者：Carberry、 M. S.、Cohen、 A. Toni.、Khalil、 Hatem M.、出版社：U.S.A. Rockville, Md. : Computer Science Press, 1986.
	Foundations of computer science 0 索取号：TP3/E804 作者：Carberry、M.S.、Carberry、 M. S.、出版社：Potomac, Md. : Computer Science Press, 1979.		Great ideas in computer science : a gentle introduction 0 索取号：TP3/E9914 作者：Biermann、 Alan W.、 1939-、出版社：Cambridge, Mass. : MIT Press, 1990.
	Aspects and prospects of theoretical computer science : 6th International Meeting of Young Computer Scientists, Smolenice, Czechoslovakia, November 19-23, 1990 : proceedings 0 索取号：TP3/E9910 作者：International Meeting of Young Computer Scientists (6th : 1990 : Smolenice、 Slovakia)、Dassow、 J.、Kelemen、 Jozef、 1951-、出版社：Berlin ; New York : Springer-Verlag, 1990.		Proceedings 0 索取号：TP29-53/E904/1 作者：IEEE International Conference on Office Automation (1st : 1984 : New Orleans、 La.)、Taylor、 R. W. (Robert William)、 1932-、Institute of Electrical and Electronics Engineers.、出版社：Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.
	International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton 0 索取号：TP274-53/E801/1977 作者：International Conference on New Developments in Automatic Testing、 Brighton、 Eng.、 1977.、Institution of Electrical Engineers. Control and Automation Division.、Institution of Electrical Engineers. Electronics Division.、出版社：London : The Institution, 1977.		Algebra for computer science 0 索取号：TP274/E902 作者：G·Ⅱrding、 Lars、 1919-、Tambour、 Torbj·□ rn.、出版社：New York : Springer-Verlag, 1988.
	Electrical and electronic instrumentation 0 索取号：TP274/E9016 作者：Chiang、 Hai Hung.、出版社：New York : Wiley, 1984.		Multivariable control system design and applications : [proceedings of a conference held] 1-3 September 1971, [at the] University of Manchester, Owens Park 0 索取号：TP273-53/E808 作者：UKAC Control Convention、 4th、 University of Manchester、 1971.、United Kingdom Automation Council.、Institution of Electrical Engineers.、University of Manchester.、出版社：London, Institution of Electrical Engineers, 1971.
	European Conference on Electronic Design Automation (EDA84), 26-30 March 1984 0 索取号：TP27-53/E902 作者：European Conference on Electronic Design Automation (1984 : University of Warwick)、Institution of Electrical Engineers. Electronics Division.、British Computer Society.、出版社：London ; New York : Venue The Institution of Electrical Engineers, 1984.		1985 IEEE International Conference on Robotics and Automation, March 25-28, 1985, Marriott's Pavilion Hotel, St. Louis, Missouri 0 索取号：TP252-53/E901/1985 作者：IEEE International Conference on Robotics and Automation (1985 : St. Louis、 Mo.)、IEEE Computer Society.、Institute of Electrical and Electronics Engineers.、出版社：Silver Spring, MD : IEEE Computer Society Press ; Los Angeles CA : Order from IEEE Computer Society, 1984.
	Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1985 作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.		Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio 0 索取号：TP216-53/E901/1982 作者：IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、出版社：New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.